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SIGLENT SDS6000A Series — 500 MHz to 2 GHz Oscilloscope
SIGLENT SDG6000X Series

SDG6000X — 120–500 MHz High-bandwidth AWG

High-bandwidth AWG to 500 MHz — 16-bit DAC, 2.4 GSa/s, radar waveform library and high-speed digital stimulus for demanding RF and signal integrity applications.

Max Frequency
120 / 200 / 500 MHz
DAC
16-bit
Sample Rate
2.4 GSa/s
500 MHz16-bitRadar waveform
ModelMax FrequencyDACSample Rate
SDG6012X120 MHz16-bit2.4 GSa/s
SDG6022X200 MHz16-bit2.4 GSa/s
SDG6052X500 MHz16-bit2.4 GSa/s

Key Features

2.4 GSa/s — High Temporal Resolution

Sub-nanosecond temporal resolution for precise edge timing and pulse width control at 500 MHz bandwidth.

Radar Waveform Generation

Generate LFM chirp, pulse-burst, stepped frequency and FMCW radar waveforms for radar echo simulation and receiver testing.

High-speed Digital Stimulus

Generate multi-Gbit data patterns, stressed eye diagrams and serial data stimulus for receiver margin testing.

16-bit DAC — High SFDR

Clean carrier generation for RF and semiconductor component characterisation with low harmonic products.

Specifications

ParameterUnitValue / Description
FREQUENCY
Max frequencyMHz120 · 200 · 500 (model-dependent)
DACbit16
Sample rateGSa/s2.4

Applications

Radar Waveform Synthesis

LFM chirp, FMCW and pulse-Doppler radar waveforms for system testing.

High-speed Receiver Test

Stressed data eye patterns for receiver margin characterisation.

Component Characterisation

Gain, compression and intermodulation testing up to 500 MHz.

DAC/ADC Testing

Precision reference signal for data converter characterisation.

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